+1 520.639.8195

Blog

July 17, 2019 Measuring Prisms: Multiple Wavefront Channels In One Setup

Prism Stacks Produce Multiple Wavefronts Prism stacks are difficult or even impossible to measure with a laser interferometer, yet are easy to measure with Spectrally Controlled Interferometry (SCI).  Examples of prism stacks for projector imaging systems, displacement measuring, monolithic or assembled component interferometers, and RGB combiners.  Laser Interferometer Back Reflections A laser light source interferometers… read more »

June 18, 2019 Measuring Prisms: S1, S2, Wavefront + Relative Angle

Prisms are complex optical components. Transmitted wavefront performance is controlled by multiple surfaces, the angle between them, and the material homogeneity.  SCI makes interferometric prism measurement fast, easy and more accurate than conventional methods. Conventional Approach: Multiple Instruments, Delayed Shipments Prisms are typically measured on multiple instruments and in several setups. A goniometer measures angles,… read more »

April 11, 2019 Total Thickness Variation (TTV)

Thickness variation (TTV), and often wedge, is specified in optical windows and substrates. There are two methods for measuring TTV: Front-to-Back and Direct. Front-to-Back TTV can only be calculated if the front and back measurements are performed without translating or moving the part. While this restriction poses challenges for traditional laser Fizeau systems, this is… read more »

April 2, 2019 Measuring Plane-Parallel Substrates

Plane-Parallel Substrates What could be easier than measuring a plate of glass? Actually, almost all interferometric measurements are easier! Measuring a plate of glass, or a substrate, is one of the most difficult interferometric measurements. In a laser interferometer, the two surfaces of the plate simultaneously interfere with the reference surface and each other creating… read more »

March 26, 2019 Spectrally Controlled Interferometry Photonics Spectra Article

Äpre Instruments has teamed with Zack Hobbs of Sydor Optics to bring an article describing SCI and some of its emerging uses. Read the article in the Photonics Spectra on-line journal. Please send us your comments and questions to inquire@apre-inst.com 

June 23, 2018 Failing Good Parts? Maybe the Problem is Retrace Error

Failing Good Parts? Maybe the Problem is Retrace Error Retrace error is rarely specified for an interferometer, often ignored and can cause good parts to fail. Knowing how to minimize, decreases scrap, saves time, and lowers manufacturing cost. Transmitted Wavefront Measurements Recently an ÄPRE upgrade customer using a 6X zoom interferometer noticed unexplained user-to-user variations…. read more »

June 14, 2018 Spectrally Controlled Interferometry – Wins Prestigious Award

ÄPRE’s Spectrally Controlled Interferometry was awarded one of Laser Focus World’s highest awards for innovation in photonics, a Gold-Level Honoree. We are proud to be recognized by this leading industry journal for the innovation that SCI brings to optical testing. Even more exciting is hearing from our customers how SCI saves time and money as… read more »

March 7, 2018 Laser Fizeau Interferometer History

The laser Fizeau interferometer has experienced several transformations from its original design. Like all evolutionary processes, some vestigial design elements remain in commonly used interferometers, which do not address and can impede measurements required to control and optimize today’s optical manufacturing processes. Circa 1850: Fizeau Interferometer Armand Hippolyte Louis Fizeau (1819 – 1896)  invented the… read more »

September 11, 2017 International Optics Participation at Eclipse 2017

Casper, WY USA, August 21, 2017 by Bob Smythe Telescopes and amateur astronomy are hobbies for many optical professionals. Observing a total eclipse is a peak experience for any astronomer, as it dramatically gives a fleeting glimpse of the solar corona and a sense of the precision motions of the solar system. My first and… read more »

September 11, 2017 China International Optoelectronic Exposition (CIOE)

  The China International Optoelectronic Exposition (CIOE) is the world’s largest exhibition serving the optics & photonics industry. 2017 was Äpre Instruments first occasion to actively participate and exhibit at CIOE. With more than 60,000 visitors attending CIOE over the four days of the exhibition, booth traffic was heavy every day and there was tremendous… read more »

Need more help? CONTACT US
  • This field is for validation purposes and should be left unchanged.
+1 520.639.8195

© 2019 Äpre Instruments / All Rights Reserved. | Design by CleanClearCreative.com