April 2, 2019 Measuring Plane-Parallel Substrates

Plane-Parallel Substrates What could be easier than measuring a plate of glass? Actually, almost all interferometric measurements are easier! Measuring a plate of glass, or a substrate, is one of the most difficult interferometric measurements. In a laser interferometer, the two surfaces of the plate simultaneously interfere with the reference surface and each other creating… read more »

March 26, 2019 Spectrally Controlled Interferometry Photonics Spectra Article

Äpre Instruments has teamed with Zack Hobbs of Sydor Optics to bring an article describing SCI and some of its emerging uses. Read the article in the Photonics Spectra on-line journal. Please send us your comments and questions to 

June 23, 2018 Failing Good Parts? Maybe the Problem is Retrace Error

Failing Good Parts? Maybe the Problem is Retrace Error Retrace error is rarely specified for an interferometer, often ignored and can cause good parts to fail. Knowing how to minimize, decreases scrap, saves time, and lowers manufacturing cost. Transmitted Wavefront Measurements Recently an ÄPRE upgrade customer using a 6X zoom interferometer noticed unexplained user-to-user variations…. read more »

June 14, 2018 Spectrally Controlled Interferometry – Wins Prestigious Award

ÄPRE’s Spectrally Controlled Interferometry was awarded one of Laser Focus World’s highest awards for innovation in photonics, a Gold-Level Honoree. We are proud to be recognized by this leading industry journal for the innovation that SCI brings to optical testing. Even more exciting is hearing from our customers how SCI saves time and money as… read more »

March 7, 2018 Laser Fizeau Interferometer History

The laser Fizeau interferometer has experienced several transformations from its original design. Like all evolutionary processes, some vestigial design elements remain in commonly used interferometers, which do not address and can impede measurements required to control and optimize today’s optical manufacturing processes. Circa 1850: Fizeau Interferometer Armand Hippolyte Louis Fizeau (1819 – 1896)  invented the… read more »

September 11, 2017 International Optics Participation at Eclipse 2017

Casper, WY USA, August 21, 2017 by Bob Smythe Telescopes and amateur astronomy are hobbies for many optical professionals. Observing a total eclipse is a peak experience for any astronomer, as it dramatically gives a fleeting glimpse of the solar corona and a sense of the precision motions of the solar system. My first and… read more »

September 11, 2017 China International Optoelectronic Exposition (CIOE)

  The China International Optoelectronic Exposition (CIOE) is the world’s largest exhibition serving the optics & photonics industry. 2017 was Äpre Instruments first occasion to actively participate and exhibit at CIOE. With more than 60,000 visitors attending CIOE over the four days of the exhibition, booth traffic was heavy every day and there was tremendous… read more »

July 25, 2017 Laser Munich 2017

Don Pearson, our VP Sales and Jan Posthumas, of LaserPeak (ÄPRE Representative) presented ÄPRE’s S100|HR interferometer in Munich this June. Once again we were pleased to meet with, and make new friends while co-exhibiting with the PTB’s HLEM (Hi-Level Experts Meeting) group. Presented was the S100|HR, part of ÄPRE’s S-Series interferometers with diffraction limited imaging… read more »

February 12, 2017 Photonics West 2017 Introductions

It was great to meet many new and old friends in San Francisco at Photonics West. Tradeshows give all of us an opportunity to discuss the challenges and opportunities facing us and discovering how working together we can help each other. Photonics West was no exception. This year we introduced the latest member of ÄPRE, Don… read more »

December 14, 2016 Piotr Szwaykowsky’s APOMA Presentation

Rarely are errors due to the interferometer itself considered when measuring optics with a laser Fizeau interferometer. Piotr gives examples of common and significant errors generated in the interferometer. Click to download his presentation with notes here. Let us know what you think! Retrace Errors Below is just an example of the error sources explored in Piotr’s presentation  

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