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Spectrally Controlled Interferometry

THE SCI SOURCE CAN BE ADDED TO ANY FIZEAU INTERFEROMETER.

This specification sheet outlines the host interferometer enhanced performance with the addition of SCI.



System Overview

Description
Standard Fizeau Interferometer with external SCI source
Measures surface form, angles and transmitted wavefront
Data Acquisition
Electronic Vibration Tolerant Phase Shifting, down to 50 um OPL
Polarization of Interferometer
Typically circular

Source Overview

Description
Proprietary, coherence controlled illumination, external to interferometer
Wavelengths available
652 nm and 633 nm (other wavelength possible)
SCI source feed
Fiber Optic 3 meters nominal
Weight
7 kg (15.4 lbs)
L X W X H mm (inch)
275 X 250 X 160 ( 11 X 10 X 6.3)

Typical Applications of a Laser Fizeau Interferometer with SCI Source

Plates/Windows/ Waveplates

Prisms, Any size >75 µm OPL per side

  • Front and back surface form and midspatial frequencies
  • Face flatness (in some cases multiple faces in one setup)
  • Total Thickness Variation (down to 75 µm OPL)
  • Transmitted wavefront
  • Thickness
  • Hypotenuse flatness
  • Wedge
  • Face parallelism
  • Transmitted Wavefront
  • Homogeneity
  • Homogeneity
  • Performance: SCI Interferometer

    Imaging Specifications (Resolution, Distortion, Field Flatness)
    Host interferometer system dependent1
    Slope Acceptance/Accuracy (Fringe Resolution & Retrace Error)
    Host interferometer system dependent1
    Repeatability/Accuracy
    Host interferometer system dependent1
    Coherence align mode
    >5 meters
    Surface Isolation (Variable)
    250 mm to 50 μm
    Working range in front of transmission flat
    Up to 250 mm
    Minimum Phase Shift Cavity2
    50 μm Optical Path Length

    Environment

    Temperature
    15°C to 30°C (59°F to 86°F)
    ΔT/Δt
    <1.0°C/15 minutes
    Humidity
    5 to 95% relative, noncondensing

    Specifications subject to change without notice.

    1 The performance of these interferometer specifications depends on the optical design of any specific system. Please refer to the host interferometers specification sheet, no degradation will occur due to the addition of the SCI source.

    2 SCI can acquire phase shifted data in a fixed etalon (plane parallel plate) down to 50 μm thin. Wavelength shifted 644 nm lasers are limited to ~9 mm cavities. This is useful for wave plate and thin window and prism metrology.

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