Measures surface form, angles and transmitted wavefront
Typical Applications of a Laser Fizeau Interferometer with SCI Source
Prisms, Any size >75 µm OPL per side
Performance: SCI Interferometer
Specifications subject to change without notice.
1 The performance of these interferometer specifications depends on the optical design of any specific system. Please refer to the host interferometers specification sheet, no degradation will occur due to the addition of the SCI source.
2 SCI can acquire phase shifted data in a fixed etalon (plane parallel plate) down to 50 μm thin. Wavelength shifted 644 nm lasers are limited to ~9 mm cavities. This is useful for wave plate and thin window and prism metrology.