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Spectrally Controlled Interferometry

THE SCI SOURCE CAN BE ADDED TO ANY S-Series INTERFEROMETER.

This specification sheet outlines the host interferometer enhanced performance with the addition of SCI.



System Overview

Description
Standard Fizeau Interferometer with external SCI source
Measures surface form, angles and transmitted wavefront
Data Acquisition
Electronic Vibration Tolerant Phase Shifting, down to 100 µm thickness
Polarization of Interferometer
Typically circular

Source Overview

Description
Proprietary, coherence controlled illumination, external to interferometer
Wavelengths available
660 nm (other wavelength possible)
SCI source feed
Fiber Optic 3 meters nominal
Weight
7 kg (15.4 lbs)
L X W X H mm (inch)
275 X 250 X 160 ( 11 X 10 X 6.3)

Typical Applications of a Laser Fizeau Interferometer with SCI Source

Plates/Windows/ Waveplates

Prisms, Any size >100 µm per side

  • Front and back surface form and midspatial frequencies
  • Face flatness (in some cases multiple faces in one setup)
  • Total Thickness Variation (down to 100 µm thin)
  • Transmitted wavefront
  • Thickness
  • Hypotenuse flatness
  • Wedge
  • Face parallelism
  • Transmitted Wavefront
  • Homogeneity
  • Homogeneity
  • Performance: SCI Interferometer

    Imaging Specifications (Resolution, Distortion, Field Flatness)
    Host interferometer system dependent1
    Slope Acceptance/Accuracy (Fringe Resolution & Retrace Error)
    Host interferometer system dependent1
    Repeatability/Accuracy
    Host interferometer system dependent1
    Coherence align mode
    >5 meters
    Range of Operation
    0.5 mm to 350 mm
    Minimum Internal Fizeau Thickness2
    350 µm
    Surface Isolation (Front or Back)
    100 µm

    Environment

    Temperature
    15°C to 30°C (59°F to 86°F)
    ΔT/Δt
    <1.0°C/15 minutes
    Humidity
    5 to 95% relative, noncondensing

    Specifications subject to change without notice.

    1 The performance of these interferometer specifications depends on the optical design of any specific system. Please refer to the host interferometers specification sheet, no degradation will occur due to the addition of the SCI source.

    2 SCI can acquire phase shifted data in a fixed etalon (plane parallel plate) down to 350 μm thin. This is useful for wave plate and thin window and prism metrology.

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