Apre Instruments

Measure multiple surface* cavities as thin as 0.075mm

Confident accuracy with no back reflections, unique real-time visual feedback, and fast electronic fringe positioning via ÄPRE patented SCI technology

^*Substrates, prisms, wafers, masks, display glass, disks, boules

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Back Reflections: Does your light source limit you?

Laser: Paint/Tape

Damaged surfaces
Time Wasting
Warps thin parts
Consumables $

Wavelength Shifting: SLOW

>1 minute acquisitions
~0.5 mm thin limit
No visual feedback
Slow=Poor repeatability

SLED/White Light: Limited

0.3 mm thin limit
Very hard to align
Limited capture range
Manual fringe positioning

SpectrÄ: Fast, accurate, easy-to-use & cost effective

Reports Key Parameters

Form/MSF, Prism Geometry,
Wedge, TTV, Thickness,
Angles, Homogeneity
Traceable results

FAST/Accurate

Easy Laser Alignment
Surface fringes viewed real-time
Millisec. acquisition, always
Fast averaging/repeatable

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Cost Effective

<1 year ROI
Modular-Add to any Fizeau
S-Series: Eff. 10X Zoom
9mm to 800mm apertures

SCI measurement of a stack of three transparent substrates in one fixed setup

Interferometers

Substrates & Prisms Measured Easily

Upgrades

Custom

Resources

REVEAL Software

At ÄPRE we advance interferometry...
So YOU can lead and succeed!

SCI is saving users hours per part via reduced preparation time
Over $4.4M saved by upgrading interferometers over buying new
Hundreds of thousands of dollars saved with multi-source interferometers
Tens of thousands of dollars saved with free software upgrades

How it Works

Your Specification »

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Training Installation »

Advanced Process Control

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Innovative and high quality products with responsive support.

President, Aperture Optical SystemsF. Tinker

The speed and quality of [APRE's] work enabled us to get another system up and running effectively and for a reasonable cost.

IQ Lab™ Manager at OptikosH. Balonek

Brief History of Fizeau Interferometry

Download a Brief History of Optical Test Fizeau Interferometry, now. To understand interferometer design and potential future directions