Interferometers for Optical Process Control

Keeping our eyes to the Horizon to boost your capabilities and profitability

Precision Metrology – Your Business Depends on it.

Are your optical metrology systems giving you just enough? Today you’re marginally meeting standards. But what about tomorrow, next month, and next year, and that leading edge customer? Äpre interferometers – designed around YOUR needs – push past your current capabilities so you can deliver more. More accuracy and resolution, with better process control and reporting.  And with faster cycle times for better ROI.

Take Control with Äpre.

Optical Measurement Solutions

Surface and Wavefront Interferometers

Fizeau and LUPI interferometers go from measurement to report in <5 seconds. Highly accurate, repeatable, and traceable.

SpectrÄ SCI for Substrates and Prisms

Spectrally Controlled Interferometers directly measure surfaces and angles in one setup, for an ROI of < 1 year.

REVEAL Optical Metrology Software

REVEAL easily generates interferometer measurement reports that are precise and traceable.

Custom Metrology Systems

Your application, your requirements, and your schedule. Partner with our experts to design and manufacture a robust, manufacturable interferometry system that includes:

• Optical Design
• Mechanical Design
• Software
• Stages, Fixtures, and Accessories

Not sure where to start? We can work from scratch or begin with a file from our library of proprietary designs. No matter where you begin, you’ll end up with a system custom-tailored for you.

Back Reflections: Does your Light source limit you?

Laser: Paint/Tape

Damaged surfaces
Time Wasting
Warps thin parts
Consumables $


Wavelength Shifting: SLOW

>1 minute acquisitions
~0.5 mm thin limit
No visual feedback
Slow=Poor repeatability

SLED/White Light: Limited

0.3 mm thin limit
Very hard to align
Limited capture range
Manual fringe positioning

SpectrÄ: Fast, accurate, easy-to-use & cost effective

Reports Key Parameters

Form/MSF, Prism Geometry,
Wedge, TTV, Thickness,
Angles, Homogeneity
Traceable results


Easy Laser Alignment
Surface fringes viewed real-time
Millisec. acquisition, always
Fast averaging/repeatable

Cost Effective

<1 year ROI
Modular-Add to any Fizeau
S-Series: Eff. 10X Zoom
9mm to 800mm apertures


Substrate Stack Measurement with SCI


The Cost of Metrology

Measure multiple surface* cavities as thin as 0.075mm

Confident accuracy with no back reflections, unique real-time visual feedback, and fast electronic fringe positioning via ÄPRE patented SCI technology

*Substrates, prisms, wafers, masks, domes, display glass, disks, boules

How it Works

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Advanced Process Control
ÄPRE's S100|HR in its first weeks of operation discovered the cause of a fabrication problem we've had for almost a year
Assistant Professor, Wyant College of Optical Sciences, UADr. B. Chalifoux
The speed and quality of [APRE's] work enabled us to get another system up and running effectively and for a reasonable cost.
IQ Lab™ Manager at OptikosH. Balonek
Innovative and high quality products with responsive support.
President, Aperture Optical SystemsF. Tinker
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INTRODUCING: Mid-Spatial Frequency Metrology