Patented SpectrÄ - Spectrally Controlled Interferometry (SCI)
Substrates & Prisms Measured Easily & Accurately to 75 µm Thin
Directly measure all surfaces and angles in one setup, for an ROI of < 1 year
SCI Makes the Impossible... Possible
Prisms: Macro & Micro
Radius of Curvature
TTV (75 µm)
Micro Prism Group
Are You Fighting Your Source, and Don't Know It?
Back reflections kill measurements, forcing hours of potentially damaging back surface painting or taping
Isolates yes, but nearly impossible to align, except your most skilled technician, wasting hours
Fourier, Scanning Laser
Limited isolation thicknesses plus time wasting, vibration sensitive, long measurement times
Save Hours, Minutes, Seconds with SCI
Align in Seconds
Fringes are easy to align in the laser mode, as you’d expect
Isolate to 100 μm Thin
Change to white light mode with a click, position fringes… no prep. needed for hours saved
Millisecond, vibration tolerant phase measurement acquisition. Its that easy!
SCI from Äpre Instruments is a breakthrough technology that allows Sydor Optics to measure substrates more efficiently than with conventional interferometry. SCI enables the accurate measurement of flat and ultra-parallel surfaces without the interference of background fringes that are common for standard interferometric systems.
Interferometer Sources: Fringe formation and data acquisition
Interferometer Sources: Fringe formation and Data Acquisition now, to learn what light source is best for your application