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Patented SpectrÄ - Spectrally Controlled Interferometry (SCI)

White Light and Laser Performance in One Source

An electronically-switchable interferometer source for easy laser alignment and <100 µm surface isolation

Are You Fighting Your Source, and Don't Know It?

Laser

Back reflections kill measurements, forcing hours of potentially damaging back surface painting or taping

White Light

Isolates yes, but nearly impossible to align, except your most skilled technician, wasting hours

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Fourier, Scanning Laser

Limited isolation thicknesses plus time wasting, vibration sensitive, long measurement times

Save Hours, Minutes, Seconds with SCI

Align in Seconds

Fringes are easy to align in the laser mode, as you’d expect

Isolate to 100 μm Thin

Change to white light mode with a click, position fringes… no prep. needed for hours saved

And Measure

Millisecond, vibration tolerant phase measurement acquisition. Its that easy!

SCI Makes the Impossible... Possible

Front/Back Surfaces

Homogeneity

Domes

Prisms: Macro & Micro

Radius of Curvature

TTV (350 µm)

TTV (100 µm)

Micro Prism Group

The Power of SCI

SCI from Äpre Instruments is a breakthrough technology that allows Sydor Optics to measure substrates more efficiently than with conventional interferometry. SCI enables the accurate measurement of flat and ultra-parallel surfaces without the interference of background fringes that are common for standard interferometric systems.
Zach HSydor Optics
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