SPIE: OPTIFAB

October 16, 2017 - October 20, 2017
Rochester, NY, USA

 

Booth 303

ÄPRE’s Chase Salsbury and Artur Olszak will present paper 10448-51 titled, “Spectrally controlled interferometry for measurements of flat and spherical optics“, in the Metrology I session on Wednesday 18 October 2017, 10:30 AM – 12:10 PM