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Spectrally Controlled Interferometry
Clean SCI fringes reduce cost and increase accuracy

SCI TRANSFORMS A STANDARD FIZEAU INTERFEROMETER

APRE’S S-SERIES QUICKLY CONVERTS BETWEEN LASER FIZEAU AND SCI FIZEAU FOR THE BEST OF BOTH WORLDS

Spectrally Controlled Interferometry — Wins Prestigious Award

ÄPRE’s Spectrally Controlled Interferometry was awarded one of Laser Focus World’s highest awards
for innovation in photonics, a Gold-Level Honoree. We are proud to be recognized by this leading industry journal for the innovation that SCI brings to optical testing.

THE FOLLOWING IS A SAMPLE OF THE GROWING RANGE OF APPLICATIONS ONLY POSSIBLE WITH SCI

From micro-optics to meter class

PLANE PARALLEL SUBSTRATES WITHOUT PREPARATION

Substrates for filters, wafers, windows, waveplates, etc., have strict tolerances on surface form and mid-spatial frequencies. SCI requires no surface preparation, aligns quickly like a laser interferometer, and measures front and back surfaces in one setup.

SCI: No preparation reduces cost with increased accuracy

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TOTAL THICKNESS VARIATION TO 100 µm

Measure TTV down to 100 µm thin substrates. There is not other direct measurement technique on thin parts and measurements take <1 second.

SCI: TTV measurement to 100 µm thin

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PRISMS: S1, S2, Wavefront + Angle

Prisms typically are measured on multiple instruments and separate setups. SCI measures four critical parameters in one setup with no preparation.

SCI: Reduces cost and increases accuracy

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MULTIPLE WAVEFRONT CHANNELS IN ONE SETUP

Prism stacks, like RGB combiner prisms, are easily measured with SCI. Moving the fringe position through the prism stack channels isolates each measurement.

SCI: One setup reduces cost, multiple wavefronts

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DOMES: S1, S2, TTV + Centration

The front and back dome spheres create confused fringes in a laser interferometer. SCI, using a standard Transmission Sphere (TS), easily aligns the dome in “laser” mode, and then measures front, back, thickness variation and centration in one set up.

SCI: Rapid qualification of domes is now possible

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SURFACE & WEDGE OF BLOCKED PARTS

SCI eliminates back reflections through the blocked flats that frustrate surface measurements with standard laser Fizeau interferometers. THEN, without moving the part, electronically move the SCI fringes to the block “reference” to measure the wedge of each part individually.

SCI: Accurate and Fast Blocked Surface and Wedge

HOMOGENEITY

Measure easy to prepare plane parallel polished parts for homogeneity, WITHOUT moving the part. SCI separates the measurement cavities required for accurate homogeneity measurement: Front, Back, Cavity and Material. SCI, combined with REVEAL’s homogeneity application, does it for you.

SCI: Easy, Accurate Homogeneity with reduced cost

CONTACT USto Arrange a Demo Today

“SCI from Äpre Instruments is a breakthrough technology that allows Sydor Optics to measure substrates more efficiently than with conventional interferometry. SCI enables the accurate measurement of flat and ultra-parallel surfaces without the interference of background fringes that are common for standard interferometric systems”

Zach H, Sydor Optics


FAST, LASER LIKE ALIGNMENT

You don’t have time to hunt for fringes. Getting the part aligned, measured and out the door is key to efficient manufacture.

SCI alignment is easy with laser like interference enabling high contrast fringes that are easy to find and align.

ISOLATES SURFACES to 100 µm THIN!

Isolating fringes on your surface is easy with SCI. You move the fringes to your surface and simply measure. There is almost no limitation to how thin your part can be. Plus there is no long wait while a laser scans and software hopefully pulls out your surface.

SCI: Fast, confident surface isolation

PHASE MEASURE THE THINNEST PARTS

Total Thickness Variation on 100 µm thin parts? No problem! And in one measurement for increased accuracy and speed.

SCI: Phase measures even the thinnest cavities

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